GL2L5MS200D Datasheet PDF - Thin Film T
Part Number | GL2L5MS200D | |
Description | (GL2L5xSxxxD) Delay Line | |
Manufacturers | Thin Film T | |
Logo | ||
There is a preview and GL2L5MS200D download ( pdf file ) link at the bottom of this page. Total 19 Pages |
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DELAY LINE TEST METHODS
Frequency Domain
Measurement
Network analysis may be used to
measure insertion loss, return loss,
phase and group delay, with signal
stimulus both forward and reverse to
the device. For our passive delay
lines, performance is indicated as
loss in the frequency domain.
The graphed information presented
in this databook is labeled according
to traditional Scattering parameters (S-parameters). S21 and S11 on the following pages
indicates insertion loss (energy incident but lost through the device) and return loss (ener-
gy incident but reflected away from the device). The data is presented in summary form,
but frequency performance data may be requested for specific part numbers.
Time Domain
Measurement
High speed (Rise Time <55 ps) dig-
ital signals are used to stimulate the
device for Rise time (Tro) and Fall
time (Tfo) performance. Data is
presented in the time domain, and is
another measure indicating frequen-
cy performance. Sampling mea-
surements can be used to demon-
strate signal fidelity and can be
processed by a variety of techniques.
Additionally, Time Domain Reflectometry (TDR) measurements may be made to provide
time delay performance as well as detailed impedance mapping of the device transmission
structure. TDR measurements can be performed either in a single end driven mode, or in
a dual end (differential) driven mode, which is necessary for the GL2L Series Differential
Delay Line product.
Preview 5 Page |
Part DetailsOn this page, you can learn information such as the schematic, equivalent, pinout, replacement, circuit, and manual for GL2L5MS200D electronic component. |
Information | Total 19 Pages | |
Link URL | [ Copy URL to Clipboard ] | |
Download | [ GL2L5MS200D.PDF Datasheet ] |
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