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PDF UPD44164365 Data sheet ( Hoja de datos )

Número de pieza UPD44164365
Descripción (UPD44164085/185/365) 18M-BIT DDRII SRAM SEPARATE I/O 2-WORD BURST OPERATION
Fabricantes NEC 
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DATA SHEET
MOS INTEGRATED CIRCUIT
µPD44164085, 44164185, 44164365
18M-BIT DDRII SRAM SEPARATE I/O
2-WORD BURST OPERATION
Description
The µPD44164085 is a 2,097,152-word by 8-bit, the µPD44164185 is a 1,048,576-word by 18-bit and the
µPD44164365 is a 524,288-word by 36-bit synchronous double data rate static RAM fabricated with advanced CMOS
technology using full CMOS six-transistor memory cell.
The µPD44164085, µPD44164185 and µPD44164365 integrates unique synchronous peripheral circuitry and a
burst counter. All input registers controlled by an input clock pair (K and /K) are latched on the positive edge of K and
/K.
These products are suitable for application which require synchronous operation, high speed, low voltage, high
density and wide bit configuration.
These products are packaged in 165-pin PLASTIC BGA.
Features
1.8 ± 0.1 V power supply and HSTL I/O
DLL circuitry for wide output data valid window and future frequency scaling
Separate independent read and write data ports
DDR read or write operation initiated each cycle
Pipelined double data rate operation
Separate data input/output bus
Two-tick burst for low DDR transaction size
Two input clocks (K and /K) for precise DDR timing at clock rising edges only
Two output clocks (C and /C) for precise flight time and clock skew matching-clock
and data delivered together to receiving device
Internally self-timed write control
Clock-stop capability with µs restart
User programmable impedance output
Fast clock cycle time : 4.0 ns (250 MHz), 5.0 ns (200 MHz), 6.0 ns (167 MHz)
Simple control logic for easy depth expansion
JTAG boundary scan
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
Document No. M15823EJ7V1DS00 (7th edition)
Date Published July 2004 NS CP(K)
Printed in Japan
The mark shows major revised points.
2001

1 page




UPD44164365 pdf
µPD44164085, 44164185, 44164365
165-pin PLASTIC BGA (13 x 15)
(Top View)
[µPD44164365F5-EQ1]
1 2 3 4 5 6 7 8 9 10 11
A /CQ
VSS
NC R, /W /BW2 /K /BW1 /LD
NC
VSS
CQ
B Q27 Q18 D18
A /BW3 K /BW0 A
D17 Q17
Q8
C D27 Q28 D19
VSS
A
A
A VSS D16 Q7 D8
D D28 D20 Q19 VSS VSS VSS VSS VSS Q16 D15 D7
E Q29
D29
Q20 VDDQ
VSS
VSS
VSS VDDQ Q15
D6
Q6
F Q30 Q21 D21 VDDQ VDD VSS VDD VDDQ D14 Q14 Q5
G D30
D22
Q22 VDDQ
VDD
VSS
VDD VDDQ Q13 D13
D5
H /DLL
VREF
VDDQ VDDQ
VDD
VSS
VDD
VDDQ VDDQ
VREF
ZQ
J D31 Q31 D23 VDDQ VDD VSS VDD VDDQ D12 Q4
D4
K Q32
D32
Q23 VDDQ
VDD
VSS
VDD VDDQ Q12
D3
Q3
L Q33 Q24 D24 VDDQ VSS VSS VSS VDDQ D11 Q11 Q2
M D33 Q34 D25 VSS VSS VSS VSS VSS D10 Q1
D2
N D34 D26 Q25 VSS
A
A
A VSS Q10 D9 D1
P Q35 D35 Q26
A
A
C
A
A Q9 D0 Q0
R TDO TCK
A
A
A /C
A
A
A TMS TDI
A
D0 to D35
Q0 to Q35
/LD
R, /W
/BW0 to /BW3
K, /K
C, /C
CQ, /CQ
ZQ
/DLL
: Address inputs
: Data inputs
: Data outputs
: Synchronous load
: Read Write input
: Byte Write data select
: Input clock
: Output clock
: Echo clock
: Output impedance matching
: DLL disable
TMS
TDI
TCK
TDO
VREF
VDD
VDDQ
VSS
NC
Remark Refer to Package Drawing for the index mark.
: IEEE 1149.1 Test input
: IEEE 1149.1 Test input
: IEEE 1149.1 Clock input
: IEEE 1149.1 Test output
: HSTL input reference input
: Power Supply
: Power Supply
: Ground
: No connection
Data Sheet M15823EJ7V1DS
5

5 Page





UPD44164365 arduino
Electrical Specifications
µPD44164085, 44164185, 44164365
Absolute Maximum Ratings
Parameter
Supply voltage
Output supply voltage
Input voltage
Input / Output voltage
Operating ambient temperature
Storage temperature
Symbol Conditions
VDD
VDDQ
VIN
VI/O
TA
Tstg
MIN.
–0.5
–0.5
–0.5
–0.5
0
–55
TYP.
MAX.
+2.9
VDD
VDD + 0.5 (2.9 V MAX.)
VDDQ + 0.5 (2.9 V MAX.)
70
+125
Unit
V
V
V
V
°C
°C
Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause
permanent damage. The device is not meant to be operated under conditions outside the limits
described in the operational section of this specification. Exposure to Absolute Maximum Rating
conditions for extended periods may affect device reliability.
Recommended DC Operating Conditions (TA = 0 to 70 °C)
Parameter
Symbol
Conditions
MIN.
TYP.
MAX.
Unit Note
Supply voltage
VDD 1.7 1.9 V
Output supply voltage
VDDQ
1.4
VDD
V1
High level input voltage
VIH (DC)
VREF + 0.1
VDDQ + 0.3 V
1, 2
Low level input voltage
VIL (DC)
–0.3
VREF – 0.1 V 1, 2
Clock input voltage
VIN
–0.3
VDDQ + 0.3 V
1, 2
Reference voltage
VREF
0.68
0.95 V
Notes 1. During normal operation, VDDQ must not exceed VDD.
2. Power-up: VIH VDDQ + 0.3 V and VDD 1.7 V and VDDQ 1.4 V for t 200 ms
Recommended AC Operating Conditions (TA = 0 to 70 °C)
Parameter
Symbol
Conditions
MIN.
TYP.
MAX.
Unit Note
High level input voltage
VIH (AC)
VREF + 0.2
– V1
Low level input voltage
VIL (AC)
VREF – 0.2
V
1
Note 1. Overshoot: VIH (AC) VDD + 0.7 V for t TKHKH/2
Undershoot: VIL (AC) – 0.5 V for t TKHKH/2
Control input signals may not have pulse widths less than TKHKL (MIN.) or operate at cycle rates less than
TKHKH (MIN.).
Data Sheet M15823EJ7V1DS
11

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