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PDF 74F2245 Data sheet ( Hoja de datos )

Número de pieza 74F2245
Descripción Octal transceiver with 30ohm equivalent output termination 3-State
Fabricantes Philips 
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No Preview Available ! 74F2245 Hoja de datos, Descripción, Manual

INTEGRATED CIRCUITS
74F2245
Octal transceiver with 30W equivalent
output termination (3-State)
Product specification
IC15 Data Handbook
1996 May 10
Philips
Semiconductors

1 page




74F2245 pdf
Philips Semiconductors
Octal transceiver with 30W equivalent output termination
(3-State)
Product specification
74F2245
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS2
LIMITS
MIN TYP1 MAX
UNIT
±10% VCC 2.4
VOH
High-level output voltage
A0-A7, B0-B7
VCC = MIN,
VIL = MAX,
VIH = MIN
IOH = –3mA
±5% VCC
±10% VCC
2.7
2.0
3.4
A0-A7, B0-B7
IOH = –12mA
±5% VCC 2.0
IOL = 5mA
±10% VCC
A0-A7, B0-B7
VOL Low-level output voltage
VCC = MIN,
VIL = MAX,
IOL = 5mA
±5% VCC
VIH = MIN
±10% VCC
A0-A7, B0-B7
IOL = 12mA
±5% VCC
0.42 0.50
0.42 0.50
0.55 0.67
0.55 0.67
VIK Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
II
Input current at maximum
input voltage
OE, T/R
A0-A7, B0-B7
VCC = 5.5V, VI = 7.0V
VCC = 5.5V, VI = 5.5V
100
1
IIH
High-level input current
OE, T/R only VCC = MAX, VI = 2.7V
20
IIL
Low-level input current
OE, T/R only VCC = MAX, VI = 0.5V
–1.2
IIH+IOZH
Off-state output current
High level voltage applied
VCC = MAX, VO = 2.7V
70
V
V
V
V
V
V
V
V
µA
mA
µA
mA
µA
IIL+IOZL
Off-state output current
Low level voltage applied
VCC = MAX, VO = 0.5V
–600 µA
A0-A7
IOS Short-circuit output current3
B0-B7
VCC = MAX
–60 –150 mA
–60 –150 mA
ICCH
60 87 mA
ICC Supply current (total)
ICCL
VCC = MAX
70 100 mA
ICCZ
75 110 mA
NOTES:
1 For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2 All typical values are at VCC = 5V, Tamb = 25°C.
3 Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
Propagation delay
An to Bn, Bn to An
Output Enable time
to High or Low level
Output Disable time
from High or Low level
TEST
CONDITION
Waveform 1
Waveform 2
Waveform 3
Waveform 2
Waveform 3
LIMITS
VCC = +5.0V
Tamb = +25°C
CL = 50pF, RL = 500
MIN TYP MAX
VCC = +5.0V ± 10%
Tamb = 0°C to +70°C
CL = 50pF, RL = 500
MIN MAX
2.5 3.5 7.0
2.5 4.0 7.0
2.5
2.5
8.5
8.0
2.5 4.5 8.0
3.5 5.5 8.5
2.0
3.5
9.5
9.5
2.5 5.0 7.0
1.5 3.5 6.5
2.0
1.0
7.5
7.0
UNIT
ns
ns
ns
1996 May 10
5

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