74ABT899DB Datasheet PDF - NXP Semiconductors
Part Number | 74ABT899DB | |
Description | 9-bit dual latch transceiver with 8-bit parity generator/checker 3-State | |
Manufacturers | NXP Semiconductors | |
Logo | ||
There is a preview and 74ABT899DB download ( pdf file ) link at the bottom of this page. Total 16 Pages |
Preview 1 page No Preview Available ! INTEGRATED CIRCUITS
74ABT899
9-bit dual latch transceiver with 8-bit
parity generator/checker (3-State)
Product specification
Supersedes data of 1993 Oct 04
IC23 Data Handbook
1998 Jan 16
Philips
Semiconductors
|
|
Philips Semiconductors
9-bit dual latch transceiver with 8-bit parity
generator/checker (3-State)
Product specification
74ABT899
PARITY AND ERROR FUNCTION TABLE
INPUTS
OUTPUTS
SEL
ODD/EVEN
xPAR Σ of High xPAR
(A or B) Inputs (B or A)
ERRt
H
H
H
Even
Odd
H
H
H
H
L
Even
Odd
L
L
H
L
H
Even
Odd
H
H
H
L
L
Even
Odd
L
L
L
H
H
Even
Odd
H
L
L
H
L
Even
Odd
H
L
L
L
H
Even
Odd
L
H
L
L
L
Even
Odd
L
H
H = High voltage level
L = Low voltage level
t = Transmit–if the data path is from A→B then ERRt is ERRA
r = Receive–if the data path is from A→B then ERRr is ERRB
* Blocked if latch is not transparent
H
L
L
H
L
H
H
L
H
L
L
H
L
H
H
L
ERRr*
H
L
L
H
L
H
H
L
H
H
H
H
H
H
H
H
Odd
Mode
PARITY MODES
Feed-through/check parity
Even
Mode
Odd
Mode
Even
Mode
Generate parity
ABSOLUTE MAXIMUM RATINGS1, 2
SYMBOL
PARAMETER
CONDITIONS
RATING
UNIT
VCC DC supply voltage
–0.5 to +7.0
V
IIK DC input diode current
VI DC input voltage3
VI < 0
–18
–1.2 to +7.0
mA
V
IOK DC output diode current
VO < 0
–50 mA
VOUT
DC output voltage3
output in Off or High state
–0.5 to +5.5
V
IOUT
DC output current
output in Low state
128 mA
Tstg Storage temperature range
–65 to 150
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 1505C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jan 16
5
Preview 5 Page |
Part DetailsOn this page, you can learn information such as the schematic, equivalent, pinout, replacement, circuit, and manual for 74ABT899DB electronic component. |
Information | Total 16 Pages | |
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Download | [ 74ABT899DB.PDF Datasheet ] |
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Featured Datasheets
Part Number | Description | MFRS |
74ABT899D | The function is 9-bit dual latch transceiver with 8-bit parity generator/checker 3-State. NXP Semiconductors | |
74ABT899DB | The function is 9-bit dual latch transceiver with 8-bit parity generator/checker 3-State. NXP Semiconductors | |
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