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What is 74ACTQ273SC?

This electronic component, produced by the manufacturer "Fairchild Semiconductor", performs the same function as "Quiet Series Octal D-Type Flip-Flop".


74ACTQ273SC Datasheet PDF - Fairchild Semiconductor

Part Number 74ACTQ273SC
Description Quiet Series Octal D-Type Flip-Flop
Manufacturers Fairchild Semiconductor 
Logo Fairchild Semiconductor Logo 


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August 1989
Revised November 1999
74ACTQ273
Quiet Series Octal D-Type Flip-Flop
General Description
The ACTQ273 has eight edge-triggered D-type flip-flops
with individual D inputs and Q outputs. The common buff-
ered Clock (CP) and Master Reset (MR) input load and
reset (clear) all flip-flops simultaneously.
The register is fully edge-triggered. The state of each D-
type input, one setup time before the LOW-to-HIGH clock
transition, is transferred to the corresponding flip-flop’s Q
output.
All outputs will be forced LOW independently of Clock or
Data inputs by a LOW voltage level on the MR input. The
device is useful for applications where the true output only
is required and the Clock and Master Reset are common to
all storage elements.
The ACTQ utilizes Fairchild Quiet Seriestechnology to
guarantee quiet output switching and improved dynamic
threshold performance. FACT Quiet Seriesfeatures
GTOoutput control and undershoot corrector in addition
to a split ground bus for superior performance.
Features
s ICC reduced by 50%
s Guaranteed simultaneous switching noise level and
dynamic threshold performance
s Guaranteed pin-to-pin skew AC performance
s Improved latch-up immunity
s Buffered common clock and asynchronous master reset
s Outputs source/sink 24 mA
s 4 kV minimum ESD immunity
Ordering Code:
Order Number Package Number
Package Description
74ACTQ273SC
M20B
20-Lead Small Outline Integrated Circuit, JEDEC MS-013, 0.300Wide Body
74ACTQ273SJ
M20D
20-Lead Small Outline Package, EIAJ TYPE II, 5.3mm Wide
74ACTQ273MTC
MTC20
20-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
74ACTQ273PC
N20A
20-Lead Plastic Dual-In-Line Package, JEDEC MS-001, 0.300Wide
Device also available in Tape and Reel. Specify by appending suffix letter Xto the ordering code.
Connection Diagram
Pin Descriptions
Pin Names
Description
D0D7
MR
Data Inputs
Master Reset
CP Clock Pulse Input
Q0Q7
Data Outputs
FACT, FACT Quiet Series, and GTOare trademarks of Fairchild Semiconductor Corporation.
© 1999 Fairchild Semiconductor Corporation DS010585
www.fairchildsemi.com

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74ACTQ273SC equivalent
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the
noise characteristics of FACT.
Equipment:
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF,
500.
2. Deskew the HFS generator so that no two channels
have greater than 150 ps skew between them. This
requires that the oscilloscope be deskewed first. It is
important to deskew the HFS generator channels
before testing. This will ensure that the outputs switch
simultaneously.
3. Terminate all inputs and outputs to ensure proper load-
ing of the outputs and that the input levels are at the
correct voltage.
4. Set the HFS generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and effect the results of the measure-
ment.
5. Set the HFS generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for
AC devices. Verify levels with an oscilloscope.
VOLP/VOLV and VOHP/V OHV:
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
Measure VOLP and VOLV on the quiet output during the
worst case transition for active and enable. Measure
VOHP and VOHV on the quiet output during the worst
case active and enable transition.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
VILD and VIHD:
Monitor one of the switching outputs using a 50coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
First increase the input LOW voltage level, VIL, until the
output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds VIL limits, or on output HIGH levels that
exceed VIH limits. The input LOW voltage level at which
oscillation occurs is defined as VILD.
Next decrease the input HIGH voltage level, VIH, until
the output begins to oscillate or steps out a min of 2 ns.
Oscillation is defined as noise on the output LOW level
that exceeds VIL limits, or on output HIGH levels that
exceed VIH limits. The input HIGH voltage level at which
oscillation occurs is defined as VIHD.
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
FIGURE 1. Quiet Output Noise Voltage Waveforms
Note 9: VOHV and VOLP are measured with respect to ground reference.
Note 10: Input pulses have the following characteristics: f = 1 MHz, tr =
3 ns, tf = 3 ns, skew < 150 ps.
FIGURE 2. Simultaneous Switching Test Circuit
5 www.fairchildsemi.com


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