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What is 100371D?

This electronic component, produced by the manufacturer "National Semiconductor", performs the same function as "Low Power Triple 4-Input Multiplexer with Enable".


100371D Datasheet PDF - National Semiconductor

Part Number 100371D
Description Low Power Triple 4-Input Multiplexer with Enable
Manufacturers National Semiconductor 
Logo National Semiconductor Logo 


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September 1998
100371
Low Power Triple 4-Input Multiplexer with Enable
General Description
The 100371 contains three 4-input multiplexers which share
a common decoder (inputs S0 and S1). Output buffer gates
provide true and complement outputs. A HIGH on the Enable
input (E) forces all true outputs LOW (see Truth Table). All in-
puts have 50 kpull-down resistors.
n 2000V ESD protection
n Pin/function compatible with 100171
n Voltage compensated operating range = −4.2V to −5.7V
n Available to MIL-STD-883
Features
n 35% power reduction of the 100171
Logic Symbol
Pin Names
I0x– I3x
S0, S1
E
Za– Zc
Za– Zc
Description
Data Inputs
Select Inputs
Enable Input (Active LOW)
Data Outputs
Complementary Data Outputs
DS100975-1
© 1998 National Semiconductor Corporation DS100975
www.national.com

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100371D equivalent
Military Version
AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
TC = −55˚C
Min Max
TC = +25˚C
Min Max
TC = +125˚C Units
Min Max
Conditions
Notes
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tTLH
tTHL
Propagation Delay
I0x–I3x to Output
Propagation Delay
S0, S1to Output
Propagation Delay
E to Output
Transition Time
20% to 80%, 80% to 20%
0.10 1.90 0.20 1.70 0.20 2.00 ns
0.40 2.70 0.60 2.40 0.50 2.90
0.50 2.70 0.60 2.40 0.50 2.90
ns
Figures 1, 2
ns
0.20 1.60 0.30 1.50 0.20 1.60 ns
(Notes 7,
8, 9, 11)
(Note 10)
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data).
Note 11: The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.
Test Circuitry
Notes:
VCC, VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50impedance lines
RT = 50terminator internal to scope
Decoupling 0.1 µF from GND to VCC and VEE
All unused outputs are loaded with 50to GND
CL = Fixture and stray capacitance 3 pF
Pin numbers shown are for flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
DS100975-6
5 www.national.com


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Featured Datasheets

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100371The function is Low Power Triple 4-Input Multiplexer with Enable. National SemiconductorNational Semiconductor
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100371DThe function is Low Power Triple 4-Input Multiplexer with Enable. National SemiconductorNational Semiconductor

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